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[IEEE Test Symposium (EWDTS) - Sevastopol, Ukraine (2011.09.9-2011.09.12)] 2011 9th East-West Design & Test Symposium (EWDTS) - Si BJT and SiGe HBT performance modeling after neutron radiation exposure
Petrosyants, Konstantin, Vologdin, Eric, Smirnov, Dmitry, Torgovnikov, Rostislav, Kozhukhov, MaximYear:
2011
Language:
english
DOI:
10.1109/EWDTS.2011.6116607
File:
PDF, 601 KB
english, 2011