Modelling of X-ray diffraction curves for GaN nanowires on...

Journal of Crystal Growth 2014 / 09 Vol. 401

Modelling of X-ray diffraction curves for GaN nanowires on Si(111)

Kladko, V.P., Kuchuk, А.V., Stanchu, H.V., Safriuk, N.V., Belyaev, A.E., Wierzbicka, A., Sobanska, M., Klosek, K., Zytkiewicz, Z.R.
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Volume:
401
Language:
english
Journal:
Journal of Crystal Growth
DOI:
10.1016/j.jcrysgro.2014.01.042
Date:
September, 2014
File:
PDF, 1.39 MB
english, 2014
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