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Electrical properties of MOS diodes In/TiO2/p-CdTe
Brus, V. V., Ilashchuk, M. I., Orletsky, I. G., Maryanchuk, P. D., Ulyanytskiy, K. S.Volume:
48
Language:
english
Journal:
Semiconductors
DOI:
10.1134/S1063782614040071
Date:
April, 2014
File:
PDF, 273 KB
english, 2014