Second-harmonic intensity and phase spectroscopy as a...

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films 2014 / 03 Vol. 32; Iss. 2

Second-harmonic intensity and phase spectroscopy as a sensitive method to probe the space-charge field in Si(100) covered with charged dielectrics

Terlinden, Nick M., Vandalon, Vincent, Bosch, Roger H. E. C., Kessels, W. M. M. (Erwin)
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Volume:
32
Language:
english
Journal:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
DOI:
10.1116/1.4862145
Date:
March, 2014
File:
PDF, 1.20 MB
english, 2014
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