A novel approach for reduction of electric field stress in...

IEEE Transactions on Dielectrics and Electrical Insulation 2013 / 10 Vol. 20; Iss. 5

A novel approach for reduction of electric field stress in vacuum interrupter chamber using advanced soft computing algorithms

Shemshadi, Asaad, Akbari, Asghar, Taghi Bathaee, Seyed
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Volume:
20
Language:
english
Journal:
IEEE Transactions on Dielectrics and Electrical Insulation
DOI:
10.1109/TDEI.2013.6633729
Date:
October, 2013
File:
PDF, 800 KB
english, 2013
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