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Effects, determination, and correction of count rate nonlinearity in multi-channel analog electron detectors
Reber, T. J., Plumb, N. C., Waugh, J. A., Dessau, D. S.Volume:
85
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.4870283
Date:
April, 2014
File:
PDF, 3.06 MB
english, 2014