[IEEE 2012 International Conference on High Voltage Engineering and Application (ICHVE) - Shanghai, China (2012.09.17-2012.09.20)] 2012 International Conference on High Voltage Engineering and Application - Arbitrary waveform impedance spectroscopy for accurate contact-free dielectric characterization
Xiangdong Xu,, Bengtsson, Tord, Blennow, Jorgen, Gubanski, Stanislaw M.Year:
2012
Language:
english
DOI:
10.1109/ICHVE.2012.6357019
File:
PDF, 323 KB
english, 2012