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Interlaboratory Study of Eddy-Current Measurement of Excess-Carrier Recombination Lifetime
Blum, Adrienne L., Swirhun, James S., Sinton, Ronald A., Yan, Fei, Herasimenka, Stanislau, Roth, Thomas, Lauer, Kevin, Haunschild, Jonas, Lim, Bianca, Bothe, Karsten, Hameiri, Ziv, Seipel, Bjoern, XioVolume:
4
Language:
english
Journal:
IEEE Journal of Photovoltaics
DOI:
10.1109/JPHOTOV.2013.2284375
Date:
January, 2014
File:
PDF, 767 KB
english, 2014