Analysis of charge sensitivity and low frequency noise limitation in silicon nanowire sensors
Lee, Jae Woo, Jang, Doyoung, Kim, Gyu Tae, Mouis, Mireille, Ghibaudo, GérardVolume:
107
Year:
2010
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.3294961
File:
PDF, 462 KB
english, 2010