Lifetime Prediction of Metallized Film Capacitors Based on...

IEEE Transactions on Plasma Science 2013 / 05 Vol. 41; Iss. 5

Lifetime Prediction of Metallized Film Capacitors Based on Capacitance Loss

Li, Zhiwei, Li, Hua, Lin, Fuchang, Chen, Yaohong, Liu, De, Wang, Bowen, Zhang, Qin, He, Wei
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Volume:
41
Language:
english
Journal:
IEEE Transactions on Plasma Science
DOI:
10.1109/TPS.2013.2243476
Date:
May, 2013
File:
PDF, 546 KB
english, 2013
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