![](/img/cover-not-exists.png)
[IEEE 2009 IEEE International Symposium on Electromagnetic Compatibility - EMC 2009 - Austin, TX, USA (2009.08.17-2009.08.21)] 2009 IEEE International Symposium on Electromagnetic Compatibility - Material parameter extraction using Time-Domain TRL (t-TRL) measurements
Rajagopal, Abhilash, Achkir, Brice, Koledintseva, Marina, Koul, Amendra, Drewniak, JamesYear:
2009
Language:
english
DOI:
10.1109/ISEMC.2009.5284640
File:
PDF, 329 KB
english, 2009