[IEEE 2009 IEEE International Symposium on Electromagnetic...

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[IEEE 2009 IEEE International Symposium on Electromagnetic Compatibility - EMC 2009 - Austin, TX, USA (2009.08.17-2009.08.21)] 2009 IEEE International Symposium on Electromagnetic Compatibility - Material parameter extraction using Time-Domain TRL (t-TRL) measurements

Rajagopal, Abhilash, Achkir, Brice, Koledintseva, Marina, Koul, Amendra, Drewniak, James
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Year:
2009
Language:
english
DOI:
10.1109/ISEMC.2009.5284640
File:
PDF, 329 KB
english, 2009
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