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[IEEE International Electron Devices Meeting. IEDM Technical Digest - Washington, DC, USA (7-10 Dec. 1997)] International Electron Devices Meeting. IEDM Technical Digest - Frame transfer area array sensor with vertical antiblooming and novel readout for enhanced performance
Kiik, M.J., Flood, C.J., Weale, G.P., Gareth Ingram, S.Year:
1997
Language:
english
DOI:
10.1109/IEDM.1997.650309
File:
PDF, 1.12 MB
english, 1997