Characterization of textured SnO2:F layers by ellipsometry...

Thin Solid Films 2013 / 5 Vol. 534

Characterization of textured SnO2:F layers by ellipsometry using glass-side illumination

Yamaguchi, Shinji, Sugimoto, Yoshio, Fujiwara, Hiroyuki
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Volume:
534
Language:
english
Journal:
Thin Solid Films
DOI:
10.1016/j.tsf.2013.02.018
Date:
May, 2013
File:
PDF, 736 KB
english, 2013
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