Microstructural origin for the piezoelectricity evolution...

Journal of Applied Physics 2013 Vol. 114; Iss. 15

Microstructural origin for the piezoelectricity evolution in (K0.5Na0.5)NbO3-based lead-free ceramics

Guo, Hanzheng, Zhang, Shujun, Beckman, Scott P., Tan, Xiaoli
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Volume:
114
Year:
2013
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.4825213
File:
PDF, 2.72 MB
english, 2013
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