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A method to predict electromigration failure of metal lines
Sasagawa, Kazuhiko, Naito, Kazushi, Saka, Masumi, Abé, HiroyukiVolume:
86
Year:
1999
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.371652
File:
PDF, 629 KB
english, 1999