Electric field effect on metallic particle contamination in a common enclosure gas insulated busduct
Nagesh Kumar, G.V., Srivastava, K.D.Volume:
14
Language:
english
Journal:
IEEE Transactions on Dielectrics and Electrical Insulation
DOI:
10.1109/TDEI.2007.344611
Date:
April, 2007
File:
PDF, 420 KB
english, 2007