[IEEE 2012 42nd Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN) - Boston, MA, USA (2012.06.25-2012.06.28)] IEEE/IFIP International Conference on Dependable Systems and Networks (DSN 2012) - Automatic fault characterization via abnormality-enhanced classification
Bronevetsky, Greg, Laguna, Ignacio, de Supinski, Bronis R., Bagchi, SaurabhYear:
2012
Language:
english
DOI:
10.1109/DSN.2012.6263926
File:
PDF, 2.06 MB
english, 2012