Techniques for latch-up analysis in CMOS IC's based on scanning electron microscopy
C. Canali, M. Giannini, E. ZanoniVolume:
28
Year:
1988
Language:
english
Pages:
43
DOI:
10.1016/0026-2714(88)90331-9
File:
PDF, 2.86 MB
english, 1988