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[IEEE 2013 IEEE International Electron Devices Meeting (IEDM) - Washington, DC, USA (2013.12.9-2013.12.11)] 2013 IEEE International Electron Devices Meeting - More than Moore: III-V devices and Si CMOS get it together
Kazior, Thomas EYear:
2013
Language:
english
DOI:
10.1109/IEDM.2013.6724711
File:
PDF, 2.62 MB
english, 2013