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[IEEE 2009 IEEE Circuits and Systems International Conference on Testing and Diagnosis - Chengdu , China (2009.04.28-2009.04.29)] 2009 IEEE Circuits and Systems International Conference on Testing and Diagnosis - Design for Low Power Testing of Computation Modules with Contiguous Subspace in VLSI
Xiao, Ji-Xue, Xie, Yong-Le, Chen, Guang-JuYear:
2009
Language:
english
DOI:
10.1109/CAS-ICTD.2009.4960801
File:
PDF, 250 KB
english, 2009