[IEEE 2014 IEEE 15th International Symposium on High-Assurance Systems Engineering (HASE) - Miami Beach, FL, USA (2014.01.9-2014.01.11)] 2014 IEEE 15th International Symposium on High-Assurance Systems Engineering - Testing of Memory Leak in Android Applications
Shahriar, Hossain, North, Sarah, Mawangi, EdwardYear:
2014
Language:
english
DOI:
10.1109/HASE.2014.32
File:
PDF, 208 KB
english, 2014