Correlation between thermal resistance, channel...

Microelectronics Reliability 1989 Vol. 29; Iss. 2

Correlation between thermal resistance, channel temperature, infrared thermal maps and failure mechanisms in low power MESFET devices

C. Canali, F. Chiussi, G. Donzelli, F. Magistrali, E. Zanoni
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Volume:
29
Year:
1989
Language:
english
Pages:
8
DOI:
10.1016/0026-2714(89)90556-8
File:
PDF, 1.13 MB
english, 1989
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