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Comparative reliability study of n+−n and n+−n−n+ Gunn diodes
I. Mojzes, B. Kovács, R. VeresegyházyVolume:
29
Year:
1989
Language:
english
Pages:
2
DOI:
10.1016/0026-2714(89)90558-1
File:
PDF, 161 KB
english, 1989