[IEEE Comput. Soc 16th International Conference on VLSI...

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[IEEE Comput. Soc 16th International Conference on VLSI Design. Concurrently with the 2nd International Conference on Embedded Systems Design - New Delhi, India (4-8 Jan. 2003)] 16th International Conference on VLSI Design, 2003. Proceedings. - Bridging fault detections for testable realizations of logic functions

Pan Zhongliang,
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Year:
2003
Language:
english
DOI:
10.1109/ICVD.2003.1183172
File:
PDF, 275 KB
english, 2003
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