[IEEE International Test Conference 2004 - Charlotte, NC, USA (26-28 Oct. 2004)] 2004 International Conferce on Test - "Real life" system testing of networking equipment
Kalidindi, S., Huynh, N., Eklow, B., Goldstein, J.Year:
2004
Language:
english
DOI:
10.1109/TEST.2004.1387380
File:
PDF, 499 KB
english, 2004