TCAD-based analysis of radiation-hardness in silicon detectors
Passeri, D., Baroncini, M., Ciampolini, P., Bilei, G.M., Santocchia, A., Checcucci, B., Fiandrini, E.Volume:
45
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/23.682456
Date:
June, 1998
File:
PDF, 807 KB
english, 1998