Using Charge Accumulation to Improve the Radiation...

IEEE Transactions on Nuclear Science 2013 / 12 Vol. 60; Iss. 6

Using Charge Accumulation to Improve the Radiation Tolerance of Multi-Gb NAND Flash Memories

Kay, Matthew J., Gadlage, Matthew J., Duncan, Adam R., Ingalls, J. David, Savage, Mark W.
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Volume:
60
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2013.2284511
Date:
December, 2013
File:
PDF, 894 KB
english, 2013
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