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Real-Time Temperature Estimation for Power MOSFETs Considering Thermal Aging Effects
Chen, Huifeng, Ji, Bing, Pickert, Volker, Cao, WenpingVolume:
14
Language:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/TDMR.2013.2292547
Date:
March, 2014
File:
PDF, 1.48 MB
english, 2014