At-Speed SEE Testing of RHBD Embedded SRAMs

IEEE Transactions on Nuclear Science 2013 / 12 Vol. 60; Iss. 6

At-Speed SEE Testing of RHBD Embedded SRAMs

Cannon, Ethan H., Tostenrude, Joe, Cabanas-Holmen, Manuel, Meaker, Barry, Neathery, Charles, Carson, Mike, Brees, Roger
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Volume:
60
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2013.2288307
Date:
December, 2013
File:
PDF, 1.13 MB
english, 2013
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