4891586 IC grabber probe

Microelectronics Reliability 1991 Vol. 31; Iss. 1

4891586 IC grabber probe

David Leber, WilliamB Tuff, Paul Verstrate
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Volume:
31
Year:
1991
Language:
english
Pages:
1
DOI:
10.1016/0026-2714(91)90473-k
File:
PDF, 190 KB
english, 1991
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