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Correlations of Cu(In, Ga)Se2 imaging with device performance, defects, and microstructural properties
Johnston, Steve, Unold, Thomas, Repins, Ingrid, Kanevce, Ana, Zaunbrecher, Katherine, Yan, Fei, Li, Jian V., Dippo, Patricia, Sundaramoorthy, Rajalakshmi, Jones, Kim M., To, BobbyVolume:
30
Year:
2012
Language:
english
Journal:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
DOI:
10.1116/1.4714358
File:
PDF, 2.75 MB
english, 2012