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Technology Scaling Comparison of Flip-Flop Heavy-Ion Single-Event Upset Cross Sections
Gaspard, N. J., Jagannathan, S., Diggins, Z. J., King, M. P., Wen, S-J., Wong, R., Loveless, T. D., Lilja, K., Bounasser, M., Reece, T., Witulski, A. F., Holman, W. T., Bhuva, B. L., Massengill, L. W.Volume:
60
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2013.2289745
Date:
December, 2013
File:
PDF, 955 KB
english, 2013