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Reliability problems of submicron MOS transistors and circuits
Wolfgang H. Krautschneider, Hartmud Terletzki, Qin WangVolume:
32
Year:
1992
Language:
english
Pages:
10
DOI:
10.1016/0026-2714(92)90447-s
File:
PDF, 827 KB
english, 1992