Multiple adjacent image processing for automated failure location using electron beam testing
D. Conard, J.D. Russell, J. Laurent, A. Skaf, B. CourtoisVolume:
32
Year:
1992
Language:
english
Pages:
6
DOI:
10.1016/0026-2714(92)90463-u
File:
PDF, 505 KB
english, 1992