Scalability of Capacitive Hardening for Flip-Flops in...

IEEE Transactions on Nuclear Science 2013 / 12 Vol. 60; Iss. 6

Scalability of Capacitive Hardening for Flip-Flops in Advanced Technology Nodes

Diggins, Z. J., Gaspard, N. J., Mahatme, N. N., Jagannathan, S., Loveless, T. D., Reece, T. R., Bhuva, B. L., Witulski, A. F., Massengill, L. W., Wen, S.-J., Wong, R.
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Volume:
60
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2013.2286272
Date:
December, 2013
File:
PDF, 429 KB
english, 2013
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