Parametric empirical Bayes approach to reliability analysis...

Microelectronics Reliability 1992 Vol. 32; Iss. 9

Parametric empirical Bayes approach to reliability analysis for the geometric life model

Ravindra K. Tyagi, Santosh Kumar, Ram C. Tiwari, Simar K. Bhattacharaya
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Volume:
32
Year:
1992
Language:
english
Pages:
12
DOI:
10.1016/0026-2714(92)90651-z
File:
PDF, 315 KB
english, 1992
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