Fuzzy states as a basis for a theory of fuzzy reliability

Microelectronics Reliability 1993 Vol. 33; Iss. 15

Fuzzy states as a basis for a theory of fuzzy reliability

Kai-Yuan Cai, Chuan-Yuan Wen, Ming-Lian Zhang
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Volume:
33
Year:
1993
Language:
english
Pages:
11
DOI:
10.1016/0026-2714(93)90065-7
File:
PDF, 737 KB
english, 1993
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