Sensitivity of High-Frequency RF Circuits to Total Ionizing...

IEEE Transactions on Nuclear Science 2013 / 12 Vol. 60; Iss. 6

Sensitivity of High-Frequency RF Circuits to Total Ionizing Dose Degradation

Jagannathan, S., Loveless, T. D., Zhang, E. X., Fleetwood, D. M., Schrimpf, R. D., Haeffner, T. D., Kauppila, J. S., Mahatme, N., Bhuva, B. L., Alles, M. L., Holman, W. T., Witulski, A. F., Massengill
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Volume:
60
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2013.2283457
Date:
December, 2013
File:
PDF, 1.23 MB
english, 2013
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