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Hot-carrier effects on leakage currents in MOSFETs—Modelling and experiment
J. Oualid, S. Burgniard, E. Ciantar, R. JérisianVolume:
33
Year:
1993
Language:
english
Pages:
19
DOI:
10.1016/0026-2714(93)90085-d
File:
PDF, 1.06 MB
english, 1993