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An empirical pseudopotential approach to surface and line-edge roughness scattering in nanostructures: Application to Si thin films and nanowires and to graphene nanoribbons
Fischetti, Massimo V., Narayanan, SudarshanVolume:
110
Year:
2011
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.3650249
File:
PDF, 2.58 MB
english, 2011