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[IEEE 2012 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2012.12.10-2012.12.13)] 2012 International Electron Devices Meeting - Uniform methodology for benchmarking beyond-CMOS logic devices
Nikonov, Dmitri E., Young, Ian A.Year:
2012
Language:
english
DOI:
10.1109/IEDM.2012.6479102
File:
PDF, 601 KB
english, 2012