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An application of spectroscopic emission microscopy and cathodoluminescence to the failure analysis of near-infrared light emitting diodes
K.L. Pey, W.K. Chim, L.S. Koh, Y.Y. Liu, S.Y.C. ChewVolume:
35
Year:
1995
Language:
english
Pages:
12
DOI:
10.1016/0026-2714(94)e0022-f
File:
PDF, 708 KB
english, 1995