Modeling study of the experimental techniques for the...

Modeling study of the experimental techniques for the characterization of MOSFET hot-carrier aging

Predrag Habaš
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Volume:
35
Year:
1995
Language:
english
Pages:
30
DOI:
10.1016/0026-2714(95)93071-h
File:
PDF, 1.43 MB
english, 1995
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