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Design of integrated BiCMOS operational amplifiers with low-probability EMI-induced-failures
P. Mattei, S. Graffi, Zs.M. Kovács-V, G. MasettiVolume:
35
Year:
1995
Language:
english
Pages:
20
DOI:
10.1016/0026-2714(95)93076-m
File:
PDF, 954 KB
english, 1995