Modeling for stuck faults in cmos non-threshold logic (NTL)...

Microelectronics Reliability 1995 Vol. 35; Iss. 4

Modeling for stuck faults in cmos non-threshold logic (NTL) combinational circuits

Asad A. Ismaeel, Rakesh Bhatnagar
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Volume:
35
Year:
1995
Language:
english
Pages:
13
DOI:
10.1016/0026-2714(95)93178-d
File:
PDF, 530 KB
english, 1995
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