Reliability of InGaAsInP based separate absorption grading...

Reliability of InGaAsInP based separate absorption grading multiplication avalanche photodiodes

P. Montangero, G.A. Azzini, H.C. Neitzert, G. Ricci, L. Serra
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Volume:
36
Year:
1996
Language:
english
Pages:
28
DOI:
10.1016/0026-2714(96)00026-1
File:
PDF, 1.31 MB
english, 1996
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