Electromigration in Al based stripes: Low frequency noise measurements and MTF tests
P.E. Bagnoli, C. Ciofi, B. Neri, G. PennelliVolume:
36
Year:
1996
Language:
english
Pages:
6
DOI:
10.1016/0026-2714(96)00028-5
File:
PDF, 463 KB
english, 1996