New experimental findings on hot carrier effects in deep...

Microelectronics Reliability 1996 Vol. 36; Iss. 11-12

New experimental findings on hot carrier effects in deep submicrometer surface channel PMOS

Jong Tae Park, Sung Jun Jang, Chong Gun Yu, Byung Gook Park, Jong Duk Lee
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Volume:
36
Year:
1996
Language:
english
Pages:
4
DOI:
10.1016/0026-2714(96)00167-9
File:
PDF, 243 KB
english, 1996
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