Comprehensive physical modeling of nmosfet hot-carrier-induced degradation
M.M. Lunenborg, H.C. De Graaff, A.J. Mouthaan, J.F. Verweij MesaVolume:
36
Year:
1996
Language:
english
Pages:
4
DOI:
10.1016/0026-2714(96)00170-9
File:
PDF, 260 KB
english, 1996