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[IEEE Proceedings of the 34th European Solid-State Device Research Conference - Leuven, Belgium (21-23 Sept. 2004)] Proceedings of the 30th European Solid-State Circuits Conference (IEEE Cat. No.04EX850) - Experimental comparison between double gate, ground plane, and single gate SOI CMOSFETs
Lolivier, J., Widiez, J., Vinet, A., Poiroux, T., Dauge, F., Previtali, B., Mouis, A., Jommah, J., Balestra, F., Deleonibus, S.Year:
2004
Language:
english
DOI:
10.1109/ESSDER.2004.1356492
File:
PDF, 231 KB
english, 2004